Institut Català de Nanociència i Nanotecnologia (ICN2), CSIC
Prof. Jordi Arbiol graduated in Physics at Universitat de Barcelona (UB) in 1997, where he also obtained his PhD (European Doctorate and PhD Extraordinary Award) in 2001 in the field of transmission electron microscopy (TEM) applied to nanostructured materials. He was Assistant Professor at UB. From 2009 to 2015 he was Group Leader at Institut de Ciència de Materials de Barcelona, ICMAB-CSIC. Since 2013 he is Vice-President of the Spanish Microscopy Society (SME). Since 2015 he is the leader of the Group of Advanced Electron Nanoscopy at Institut Català de Nanociència i Nanotecnologia (ICN2), CSIC and The Barcelona Institute of Science and Technology (BIST). He has been awarded with the 2014 EMS Outstanding Paper Award, the EU40 Materials Prize 2014 (E-MRS), listed in the Top 40 under 40 Power List (2014) by The Analytical Scientist and the PhD Extraordinary Award in 2001 (UB).
The increasing interest in Materials Science, Nanoscience and Nanotechnology has created a serious global need for the development of nanoscopy tools in order to be able to observe and chemically analyze the synthesized nanostructures at atomic scale. Exploring the limits of physical resolution in advanced electron microscopy and understanding the ultimate behavior of materials at the nanoscale and their related properties are the central aims of my research. The newest research lines we are working in are based on single atom recognition and localization in embedded quantum structures. In parallel I am interested in finding methodologies to perform a direct correlation between the structural and chemical properties at the atomic scale and the physical properties at sub-nanometer scale (photonics, plasmonics and phononics).